WPDDA6505 晶圓探測動態分析儀
Wafer Probing Device Dynamics Analyzer

 　　Trapping and degradation drastically limit the performance and lifetime of GaN transistors, so the dynamical measurement plays a crucial role in understanding and developing GaN-based power device. Our instruments provide powerful solution to probe electric properties under high switching frequency and stress voltage which truly reveals the system-like behavior of GaN.